Surface analysis Assignment Example | Topics and Well Written Essays - 1750 words

Surface analysis - Assignment ExampleThese ions on collision dislodge atoms from the surface creating inessential ions. Using a combination of electrostatic and magnetic fields which distinguishes the ions on the mass to charge ratio, these unessential ions are drawn into a mass spectrometer. By varying the strength of the magnetic field ane apprize assess ions of different mass to charge ratios. (Surface Analysis, 2000) Some of the applications of SIMS include (i) Identifying the isotopes in a genuine that might have comparable atomic masses as it is overt of producing mass resolutions to tune of 7000. (ii) It is receptive of finding out the extent of impurity concentration present in a specimen and represents the same as a function of depth. The sensitivity of this instrument is in the range of 1 ppb (-1013 at/cm3) (iii) It can accurately map the interface layers and the impurities that may be located at these tittle boundaries. (iv) It uses the raster scanning technique t o produce three dimensional images of the grain distribution. (v) Using the secondary ions it can directly produce an image showing the arrangement of trace elements. character reference Surface Analysis, 2000 2. ... Some of the applications of AES include (i) This is use to identify compositions of elements in solid materials with eminent output sensitivities in the range of 0.5 atomic percent for atomic number 3 to uranium. (ii) This is reclaimable in carrying out the volumetric analysis of a specimen. (iii) This is capable of producing magnified images to the tune of 20000x and is utilize extensively in microelectronics. 3. X-Ray Photoelectron Spectroscopy (XPS) (Surface Analysis, 2000) This advanced technique uses x rays in dislodging electrons from specimens and these have trenchant kinetic energies depending on the nature of emitted electrons. It is particularly useful in providing learning regarding the type of bonds that exist in the midst of electrons. This is becaus e any change in binding energy is reflected in the XPS spectrum chart which shows crests and troughs. The crests obviously reflect the high chemical boding energy that existed and the troughs vice versa. Its applications include (i) Determining molecular composition of surfaces along with information regarding the atomic bonding. (ii) It can identify very accurately to the tune of 0.5 atomic % the presence of lithium and uranium. (iii) This can create depth profiles for materials in the range of 1m thickness. (iv) This method of analysis is particularly useful to study functional groups in polymers. 4. Scanning Probe Microscopy (SPM) This is also referred to as Atomic Force Microscopy (AFM). This is capable of generating a profile that shows the topographical nature of the specimen surface. Schematic of atomic force microscope operation Source Surface Analysis, 2000 This essentially consists of a tip mounted on a cantilever. The specimen is placed downstairs this cantilever and